Optical and structural investigation on InGaN/GaN multiple quantum well light-emitting diodes grown on sapphire by metalorganic chemical vapor deposition

InGaN/GaN multiple quantum well (MQW) light emitting diode (LED) structures with blue and green light emissions have been grown on sapphire substrates by metalorganic chemical vapor deposition. They are investigated by high-resolution X-ray diffraction (HR-XRD), high-resolution transmission electron microscopy (HR-TEM), photoluminescence (PL) and photoluminescence excitation (PLE). HR-XRD showed multiple satellite peaks up to 10th order due to the quantum well superlattice confinement effects. HR-TEM determined the MQW structures and parameters, indicating the high quality of layer interfaces of these LED samples. Excitation power-dependent PL predicates that both piezoelectric field-induced quantum-confined Stark effect and band filling effect influence the luminescent properties. Temperature-dependent PL shows that the QW PL emission peak exhibits a monotonic red-shift and that the full width at half maximum of the PL band shows a Wshaped temperature-dependent behavior with increasing temperature. From the PLE results, a large energy difference, so-called quantum confined Stokes shift, between the band-edge absorption and emission was observed. Penetrating TEM revealed the V-shape defects, and quantum dot-like structures within the InGaN well region, which leads to intense light emissions from these MQW LEDs.